Program
Dear Conference participants! Please mind that this is a preliminary version and some items in the Program may change.
Tuesday – 4 JULY
5 Building, CONFERENCE HALL
- 10:00 - 11:00 PARTICIPANT REGISTRATION
- 11:00 - 11:10 WELCOME SPEECH by EMC Compo TPC (Etienne Sicard)
- 11:10 - 11:20 WELCOME SPEECH by ETU (Mikhail Shestopalov)
- 11:20 - 12:20 KEYNOTE SPEECH by Prof. Alex Yakovlev, by Prof. Milos Krstic
(in cooperation with Xin Fan, Milan Babic, Eckhard Grass, Tobias Bjerregaard)
Reducing Switching Noise Effects by Advanced Clock Management
- 12:20 - 13:00 Technical section «EMC-aware Design and Guidelines»
| Lammert Duipmans, Dusan Milosevic, Arnoud van der Wel, Peter Baltus | Identifying EMC-Critical Devices by Monitoring and Classifying Operating Region Transitions |
| Alexandre Martorell, Jeremy Raoult, Robin Marijon, Laurent Chusseau | EMI Functional Vulnerability Identification in RF Front-Ends |
- 13:00 – 14:00 Lunch
- 14:00 – 15:20 Technical section «EMC of Digital ICs»
| Chaimae Ghfiri, Alexandre Boyer, Andre Durier, Sonia Ben Dhia Paulo R.C. Villa, Roger C. Goerl, Fabian Vargas, Nilberto Heder Medina, Nemitala Added, Vitor A. P. De Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei A. G. Da Silveira, Eduardo Bezerra, Leticia Poehls |
Methodology of Modeling of the Internal Activity of a FPGA for Conducted Emission Prediction Purpose Analysis of ProASIC3 FPGA SEU-Sensitivity to Combined Effects of Conducted-EMI and TID |
| Mario Auer and Timucin Karaca | Digitally Assisted EMI-Reduction Techniques for Class-D Amplifiers with Digital Control |
| Bernd Deutschmann, Bernhard Auinger, Gunter Winkler |
Spread Spectrum Parameter Optimization to Suppress Certain Frequency Spectral Components |
- 15:20 – 15:40 COFFEE BREAK
- 15:40 – 16:20 Technical section «Materials for Improved EMC of ICs»
| Masahiro Yamaguchi, Yasushi Endo, Peng Fan, Jingyan Ma, Satoshi Tanaka, Yasunori Miyazawa, Makoto Nagata | Analysis of Patterned Magnetic Thin-Film Noise Suppressor for RF IC Chip |
| Bumhee Bae, Sukjin Kim, Youngkun Kwon, Hyunggeun Kim, Sunkyu Kong, Joungho Kim, Harkbyeong Park | Shielding Effectiveness of Noise Coupling on Analog-to-Digital Converter in Magnetic Field Wireless Power Transfer System |
- 16:30 – 17:30 Visit to the A. Popov's Laboratory & Apartment Museum
- 17:30 – 20:00 Welcome reception
Wednesday – 5 JULY
5 Building, CONFERENCE HALL
- 10:00 – 11:20 Technical section «EMC of Transceiver ICs»
|
Matthieu Deloge, Jaume Tornila Oliver, Hans Brekelmans, Peter Vermeeren, Gert Jan Bollen, Arnoud van der Wel, Gerald Kwakernaat, Adrien Schoof |
A Time-Continuous Bus-Feedback LIN Transceiver in 0.14 мm High-Voltage SOI CMOS |
|
Kohki Taniguchi, Makoto Nagata, Akihiro Tsukioka, Daisuke Fujimoto, Noriyuki Miura, Takao Egami, Rieko Akimoto, Kenji Niinomi, Terumitsu Komatsu, Yoshinori Fukuba, Atsushi Tomishima |
Susceptibility Evaluation of CAN Transceiver Circuits with In-Place Waveform Capturing under RF DPI |
|
Kamel Abouda, Adrien Doridant, Bertrand Vrignon, Nicolas Baptistat, Matthieu Aribaud |
Improving Electro-Magnetic Susceptibility Performances of High Side Switches: Case of High Side of LIN Physical Layers |
| M. Burak Baran, Hugo Pues, Kristof Stijnen, Wim Dehaene | EMI Resisting Low-EME SENT Drivers in 0.18мm CMOS |
- 11:20 – 11:40 COFFEE BREAK
- 11:40 – 13:00 Technical section «EMC of Power Devices and Systems»
|
Alexandre Boyer, Manuel Gonzalez Sentis, Chaimae Ghfiri, Andre Durier |
Modeling Methodology of the Conducted Emission |
|
Alexandre Boyer, Manuel Gonzalez Sentis, Chaimae Ghfiri, Andre Durier |
Study of the Thermal Aging Effect on the Conducted Emission of a Synchronous Buck Converter |
|
Volha Subotskaya, Emanuele Bodano, Bernd Deutschmann |
Adaptive Current Source Driver for High-Frequency Boost Converter |
| Raul Blecic, Josip Bacmaga, Renaud Gillon, Bart Nauwelaers, Adrijan Baric | EMC-Oriented Design of Output Stage of Synchronous Buck Converter |
- 13:00 – 14:00 LUNCH
- 14:00 – 15:00 KEYNOTE SPEECH by Prof. Victor Luchinin
(in cooperation with Alexey Afanasjev, Anatoly Petrov and Vladimir Ilyin)
Family of Micro Key Based on SiC for Extreme Conditions and Duty - 15:00 – 15:20 COFFEE BREAK
| Vitaliy Vitko, Andrey Nikitin, Alexey Ustinov, Boris Kalinikos | Theory of Optoelectronic Oscillators Based on Serially Coupled Multiple Micro-Ring Resonators |
| Irina Ustinova, Andrey Nikitin, Alexey Ustinov, Boris Kalinikos and Erkki Lahderanta | Logic Gates Based on Multiferroic Microwave Interferometers |
|
Anatoly Dudin, Ilya Kogan, Georgiy Yakovlev, Maria Mironova, Igor Schukov, Dmitriy Frolov, Vasiliy Zubkov, Gennadii Glinskii |
Simulation and Characterization of |
|
Nikita Permiakov, Anton Evseenkov, Sergey Tarasov, Alexander Solomonov, Vyacheslav Moshnikov, Ivan Lamkin |
Detection Methods of Intense Areas and Identification of the Reasons of HEMT Transistors Failure |
|
Vladimir Tikhomirov, Aleksandr Gudkov, Victor Petrov, Svetlana Agasieva, Andrei Zybin, Viktor Yankevich, Anton Evseenkov |
Simulation of Electric Field Distribution in GaN HEMTs for the Onset of Structure Degradation |
- 17:00 – 19:00 Visit to ETU CMID Research Center Laboratories
Thursday – 6 JULY
5 Building, CONFERENCE HALL
- 10:00 – 11:00 Technical section «Near Field Scan Methods for ICs»
| Bertrand Vrignon, Kamel Abouda, Adrien Doridant, Nicolas Baptistat | Time-Domain Measurements Using Near Field Scanning Method for Fast Transient Current Reconstruction |
|
Nicolas Lacrampe, Sebastien Serpaud, |
Radiated Suceptibility Investigation of Electronic Board from Near Field Scan Method |
|
Massiva Zouaoui, Etienne Sicard, Henri Braquet, Ghislain Rudelou, Emmanuel Marsy and Gilles Jacquemod |
Impact of NFSI on the Clock Circuit of a Gigabit Ethernet Switch |
- 11:00 – 11:20 COFFEE BREAK
- 11:20 – 13:00 Technical section «ESD Modelling and Analysis»
|
Thomas Ungru, Wolfgang Wilkening, Renato Negra |
Influence of ESD on an Integrated Shift Register in Operation |
|
Niels Lambrecht, Hugo Pues, Daniel De Zutter, |
Circuit Modeling of the ISO 10605 Field Coupled Electrostatic Discharge Test to Design Robust Automotive Integrated Circuits |
|
Friedrich Zur Nieden, Lena Zeitlhofler, Kai Esmark, Reinhold Gartner |
Characterization of a 1-Pin Stress ESD Testing Method for the Analysis of Nanosecond-Range Charging Effects |
| Tohlu Matsushima, Mayumi Aoki, Takashi Hisakado, Osami Wada | Equivalent Circuit Model with Nonlinear Characteristics of Zener Diode Extracted from SPICE Model for ESD Simulation |
| Mario Rotigni, Mauro Merlo, Martina Cordoni, Paolo Colombo, Valentino Liberali | Conducted Emissions in a 40 nm CMOS Test Chip: The Role of ESD Protections |
- 13:00 – 14:00 LUNCH
- 14:00 – 15:20 Technical section «Measurement and Modelling of IC EMC»
| Anna Richelli, Luigi Colalongo, Lorenzo Toninelli, Ion Rusu, Jean-Michel Redoute | Measurements of EMI Susceptibility of Precision Voltage References |
| Pierre Payet, Jeremy Raoult, Laurent Chusseau | Disruption of a RF Front-End Subject to a Out-of-Band Signal |
| Sebastien Serpaud, Alexandre Boyer, Chaimae Ghfiri and Andre Durier | Proposal for Combined Conducted and Radiated Emission Modeling for Integrated Circuit |
|
Andrea Lavarda, Bernd Deutschmann, Haerle Dieter |
Enhancement of the DPI Method for IC Immunity Characterization |
- 15:20 – 15:30 COFFEE BREAK
- 15:30 – 16:30 Poster Session
| Alexander Chupakhin, Volodymyr Pilinsky, Oleg Petrischev |
The method of determination the level of lowfrequency interference induced by ferromagnetic component on the PCB |
|
Hyun Ho Park, Keonyoung Seo, Young-Kun Kwon, Hark-Byeong Park |
Numerical Analysis of Conformal Shields for Chip and Package Shielding |
| Binhong Li, Jiantou Gao, Bo Li, Zhengsheng Han, Jiajun Luo, Jianfei Wu, Wei Zhu | Impact of DSOI Back-Gate Biasing on Circuit Conducted Emission |
| Jianfei Wu, Haiyan Ma, Hongli Zhang, Binhong Li, H. Wang and Liming Zheng | DPI Immunity of Bandgap in SI and SOI Technologies |
| Tvrtko Mandic, Renaud Gillon, Adrijan Baric | An Experimental Investigation of Four-Port IC-Stripline |
| Michael Fuchs | Design of an EMC Test Board for Analog-to-Digital Converters |
| Taras Kustov, Semen Grin, Sakhaya Burnasheva | Efficiency Improvement Means for Operation of Linear Photo Detector Controller Based on CCD Line |
| Shih-Yi Yuan, Jia-Wei Chen, Ming-Shan Lin, Jian-Li Dong | Application-specific Near Field EMI Estimation on Time-Sharing Operating System |
|
Valerio M. Salles, Luiz C. Kretly |
Guidelines to Establish Design and Simulation of AC-Clocked Power Supply in Digital CVSL Circuits: the Base to Implement Complex Sequential Circuits |
| Leslie Bai | Test Methods For 2.4GHz ISM Data Transmission Equipment Compliant with EU Regulations |
| Bogdan Vasiliev, Viacheslav Zyrin | Analysis of Electromagnetic Compatibility for Two-Level Frequency Converter with the Electric Motor and Power Quality at the Inverter Output |
| Bogdan Vasiliev, Viacheslav Zyrin | Power Flow Research and Electromagnetic Compatibility between Frequency Converter and Electric Motor |
- 17:00 DEPARTURE TO THE SOCIAL EVENT
- 18:00 – 21:00 CONFERENCE SOCIAL EVENT
Friday – 7 JULY
5 Building, CONFERENCE HALL
- 11:00 – 12:00 Technical section «Computational Electromagnetics for IC level EMC»
|
Vadim Goncharov, Eugene Fiskin, Rostislav Yashkardin, |
Method of Calculating of Random Shaped Electromagnetic Impulse Flowing through Conducting Structures |
| Zhifei Xu, Yang Liu, Blaise Ravelo, Olivier Maurice | Modified Kron's TAN Modeling of 3D Multilayer PCB |
| Sergey Miropolsky, Stefan Jahn, Frank Klotz | EM Field Solver Modelling of the Floating EUT Module Boards in Automotive EMC Test Setups |
- 12:00 CLOSING SPEECH by Etienne Sicard
- 12:10 CLOSING SPEECH by Mikhail Shestopalov
Contact Us: IRVC.eltech@mail.ru